A compact one-port analyzer for RF reflection measurements from 1 MHz to 6 GHz. Its lightweight, USB-powered design suits direct connection to the device under test, portable measurements, and integration into automated test systems.

• Frequency range: 1 MHz to 6 GHz
• Test port: 1 × N-type male, 50 Ω
• Dynamic range: 119 dB typ.
• Output power: -40 to 0 dBm typ.
• Measurement time: 100 μs per point
• Control and power: USB

A compact one-port analyzer extending measurement coverage to 15 GHz. Available with N-type or 3.5 mm test connectors, it is designed for RF and microwave component testing, field measurements and automated measurement systems.

• Frequency range: 85 MHz to 15 GHz
• Test port: 1 × N-type or 3.5 mm, 50 Ω
• Dynamic range: 125 dB up to 4.8 GHz; 105 dB above 4.8 GHz.
• Output power: -25 to 0 dBm
• Measurement time: 170 μs per point
• Control and power: USB

FOR BOTH X606 AND X615

INCLUDED CAPABILITIES:

• Reflection and cable-loss measurements
• Time-domain analysis with gating
• Fixture simulation
• Waveguide calibration

OPTIONAL CAPABILITY:

• RNVNA — Two-Reflectometer Transmission Measurement. Measures transmission magnitude using two synchronized 1-port analyzers.

HARDWARE SUPPORT:

• Compatible Automatic Calibration Modules are available for faster and more repeatable calibration.

Cost-effective two-port analyzer for one-way transmission and reflection measurements up to 1.3 GHz.

• Frequency range: 0.3 MHz to 1.3 GHz
• Test ports: 2 × N-type female, 50 Ω
• Measured parameters: S11, S21
• Dynamic range: 130 dB typ.
• Output power: -55 to +3 dBm
• Measurement time: 150 μs per point

75 Ω 2-PORT VNA

Compact 75 Ω analyzer for cable, broadcast and telecommunications measurements up to 4 GHz.

• Frequency range: 100 kHz to 4 GHz
• Test ports: 2 × N-type female, 75 Ω
• Measured parameters: S11, S21, S12, S22
• Dynamic range: 133 dB typ.
• Output power: -50 to +10 dBm
• Measurement time: 24 μs per point

2-port VNAs with selectable frequency ranges of 1.5/3/4.5/6.5/9 GHz for RF development, testing, and automated measurement systems.

• Frequency range: 9 kHz to 9 GHz
• Test ports: 2 × N-type female, 50 Ω
• Dynamic range: up to 137 dB typ.
• Output power: −55 to +5 dBm
• Measurement time: 24 μs per point
• Control: USB-C

High-performance compact two-port analyzer for RF and microwave measurements up to 18 GHz.

• Frequency range: 100 kHz to 18 GHz
• Test ports: 2 × N-type female, 50 Ω
• Dynamic range: 135 dB typ. up to 8 GHz
• Output power: −45 to +10 dBm
• Measurement time: 24 μs per point
• Control: USB

Compact two-port and four-port analyzers for advanced microwave measurements and automated testing up to 44 GHz.

• Frequency range: 10 MHz to 44 GHz
• Test ports: 2 or 4 × 2.4 mm male, 50 Ω
• Dynamic range: 135 dB typ.
• Output power: −50 to 0 dBm
• Measurement time: 22 μs per point
• Control: USB

SOFTWARE OPTIONS:

• PLS-X - Pulsed Measurements
• SPM-X - Spectrum Measurements
• AFR-X - Automatic Fixture Removal
• IMH-X - Intermodulation Measurements
• ACP-X - Advanced Compression Point Measurements

HARDWARE SUPPORT:

• Automatic Calibration Modules

A configurable multiport measurement platform combining an integrated RF switching matrix with vector network analysis in a single system.

X709 SERIES MODELS:

• X709-06: 6 ports
• X709-08: 8 ports
• X709-10: 10 ports
• X709-12: 12 ports
• X709-14: 14 ports
• X709-16: 16 ports

• Frequency range: 300 kHz to 9 GHz
• Test ports: 6–16 × N-type female, 50 Ω
• Dynamic range: 140 dB typ.
• Output power: −45 to +10 dBm
• Measurement time: 24 μs per point
• Logical channels: up to 32
• Control: USB

FOR THE X709 SERIES

SOFTWARE OPTIONS:

• TD-X — Time Domain Measurements. Locate discontinuities and evaluate impedance changes along cables and signal paths.
• MXR-X — Mixer Measurements. Measure frequency-converting devices using scalar and vector methods.
• AFR-X — Automatic Fixture Removal. Remove fixtures, adapters and interconnections from measurement results.
• IMH-X — Intermodulation Measurements. Evaluate intermodulation products and nonlinear device behavior.
• ACP-X — Advanced Compression Point Measurements. Characterize amplifier compression across frequency and power.

HARDWARE SUPPORT:

• Automatic Calibration Modules. Faster and more repeatable calibration of the measurement setup.

High-dynamic-range 2-port and 4-port analyzers for demanding RF measurements and high-speed automated testing.

• Frequency range: 100 kHz to 9 GHz
• Test ports: 2 or 4 × N-type female, 50 Ω
• Dynamic range: 152 dB typ.
• Output power: −60 to +15 dBm
• Measurement time: 10 μs per point
• Measurement points: up to 500,001

Configurations: standard, direct receiver access or frequency-extension support.

Configurable 2-port and 4-port platforms for microwave component development, production testing and extended-frequency measurement systems.

• Frequency range: 100 kHz to 20 GHz
• Test ports: 2 or 4 × 3.5 mm male, 50 Ω
• Dynamic range: 135 dB typ.
• Output power: −60 to +10 dBm
• Measurement time: 12 μs per point
• Measurement points: up to 500,001

Configurations: standard, direct receiver access or frequency-extension support.

Advanced 2-port and 4-port analyzers with direct access to internal sources and receivers for flexible active and passive device measurements.

• Frequency range: 100 kHz to 22.5 GHz
• Test ports: 2 or 4 × 3.5 mm male, 50 Ω
• Internal sources: 1 or 2
• Dynamic range: 144 dB typ.
• Output power: −60 to +15 dBm
• Measurement time: 10 μs per point

High-frequency 2-port and 4-port analyzers for precision microwave measurements, active-device characterization and production testing up to 44 GHz.

• Frequency range: 10 MHz to 44 GHz
• Test ports: 2 or 4 × 2.4 mm male, 50 Ω
• Internal sources: 1 or 2
• Dynamic range: 140 dB typ.
• Output power: −50 to +10 dBm
• Measurement time: 10 μs per point

• TD-X — Time Domain Measurements. Locate discontinuities and analyze signal paths in the time domain.
• MXR-X — Mixer Measurements. Characterize mixers, converters, and other frequency-changing devices.
• NF-X — Noise Figure Measurements. Measure noise figure and gain of amplifiers and receiver devices.
• PLS-X — Pulsed Measurements. Perform point-in-pulse, pulse-profile, and asynchronous pulse measurements on compatible models.
• AFR-X — Automatic Fixture Removal. Remove the effects of fixtures, adapters and interconnections.
• IMH-X — Intermodulation Measurements. Evaluate intermodulation products and nonlinear behavior.
• ACP-X — Advanced Compression Point Measurements. Characterize amplifier compression across frequency and power.

• Automatic Calibration Modules
• Frequency Extension Modules
• Direct Receiver Access
• External source and receiver configurations

Option and hardware availability depend on the selected analyzer configuration.

Compact automatic calibration modules for general-purpose RF analyzers, laboratory measurements and automated test systems.

• XC7204: 20 kHz to 4 GHz, 75 Ω
• XC5206: 20 kHz to 6 GHz, 50 Ω
• XC5209: 20 kHz to 9 GHz, 50 Ω
• XC5409: 100 kHz to 9 GHz, 50 Ω
• Ports: 2 or 4
• Connectors: N-type or 3.5 mm

Two-port and four-port calibration modules for microwave analyzers and higher-frequency measurement configurations.

• XC5220: 100 kHz to 20 GHz, 2 ports
• XC5420: 100 kHz to 20 GHz, 4 ports
• XC5232: 10 MHz to 32 GHz, 2 ports
• Impedance: 50 Ω
• Connectors: N-type or 3.5 mm
• Calibration: one-port, two-port or multiport

High-frequency two-port calibration module for compact and benchtop microwave analyzers operating up to 44 GHz.

• Frequency range: 10 MHz to 40 GHz with 2.92 mm connectors; 10 MHz to 44 GHz with 2.4 mm connectors
• Ports: 2
• Impedance: 50 Ω
• Connectors: 2.92 mm or 2.4 mm
• Calibration: one-port and two-port
• Effective directivity: up to 47 dB

For accurate S-parameter measurement of installed coaxial and twisted-pair cable assemblies without requiring a long return test cable.

• Frequency range: 20 kHz to 6 GHz
• Ports: 2
• Impedance: 50 Ω
• Connectors: N-type or 3.5 mm
• Control: Mini USB
• Battery operation: up to 200 hours
• Compatible equipment: VNA required

Compact frequency-extension module for expanding compatible benchtop VNA configurations up to 54 GHz.

• Frequency range: 18 to 54 GHz
• Test port: 1 × 1.85 mm male, 50 Ω
• Dynamic range: up to 140 dB typ.
• Output power: up to +3 dBm
• Measurement time: 12 μs per point
• System configurations: up to 2 or 4 modules

Compatible VNAs: X4209 / X4409 / X4220 / X4420

We can supply available transmitter and receiver configurations for specialized measurement systems.

For advanced millimeter-wave component development, laboratory research and high-frequency device characterization.

• System configurations: up to 2 or 4 modules
• Optional attenuation: 0 to -35 dB
• Measurement capabilities: S-parameters, balanced and time-domain measurements
• Compatible VNAs: X4220 (2-port benchtop VNA), and X4420 (4-port benchtop VNA)

AVAILABLE FREQUENCY BANDS:

• XVECTOR 50-75 GHz. WR-15 waveguide, +14 dBm output power, 120 dB dynamic range
• XVECTOR 75-110 GHz. WR-10 waveguide, +10 dBm output power, 120 dB dynamic range
• XVECTOR 110-170 GHz. WR-06 waveguide, -2 dBm output power, 110 dB dynamic range

Broadband solid-state switching modules for expanding two VNA ports into 8 or 16 selectable RF measurement paths.

• Frequency range: 10 MHz to 18 GHz
• Impedance: 50 Ω
• Connectors: N-type female
• Insertion loss: ≤10 dB
• Signal isolation: ≥92 dB
• Maximum switching power: 30 dBm
• Switching time: ≤200 ns
• Installation: desktop or 19-inch rack
• Rack height: 2U for X708-18A; 3U for X716-18A

Control the port expander as part of an automated measurement system or operate it as an independent RF switching device.

• Control interface: USB
• External triggering: BNC trigger inputs
• Remote control: VISA library and SCPI commands
• Control software: Switch Control
• Automatic termination: unused output ports are switched to matched internal loads

Characterize antennas, feeding networks and wireless devices using conducted or over-the-air measurements

Applications include antenna matching and impedance measurement, return-loss verification, radiation-pattern testing and integration with positioners or anechoic chambers for telecommunications, aerospace and wireless-device development.

Integrate CRXVT analyzers into automated verification, quality-control and manufacturing environments

Typical tasks include testing filters, amplifiers, attenuators, couplers, mixers, RF modules, cables and connectors, as well as incoming inspection, production testing and final product verification.

Apply microwave measurement techniques to material characterization and industrial process monitoring

VNA-based systems can evaluate dielectric properties and detect changes associated with moisture, density, composition or material condition. Specific configurations are developed according to the material, frequency range and measurement environment.

Use CRXVT VNAs with switching equipment and antenna arrays as the measurement core of specialized non-destructive inspection systems

Potential applications include detecting cracks, voids and structural changes, inspecting refractory linings and large industrial vessels, and producing cross-sectional microwave images. Qualified integration partners configure and implement complete systems for the specific task.